HASO4 FIRST 波前传感器 基于Hartmann-Shack技术。能够同时对相位和强度进行绝对测量。测量快速、准确,集成化设计使之体积十分小巧,对环境震动不敏感,是工业领域与科研领域的理想选择。
我们独特的出厂校准,先进的软件和高质量的微透镜阵列保证了HASO4 FIRST优于任何竞争对手的性能。
HASO4 FIRST 采用USB3.0接口,通过软件设置,用户可以在普通模式100Hz和高速模式165Hz下使用。
产品特点:
● λ/100 绝对测量精度,同时保证400λ的动态范围
● 专利的波前算法保证在任意激光强度分布下波前测量精度不变
● 能够测量64项Zernike系数,每项系数测量精度优于2nm rms
● 可以直接测量发散光或会聚光的波前
● 可以测量PST、MTF、M2、和Strehl ratio等参数
应用:
● 激光波前/强度检测
● 自适应光学, 如: 高能量激光; 多光子显微镜; 激光通讯
● 光学元件或光学系统像差分析
● 平行光管,望远镜系统的装调
性能指标:
Operating mode |
Full resolution |
High speed (option) |
Aperture dimension |
3.6 x 4.6 mm² |
1.8 x 1.8 mm² |
Number of microlenses |
32 x 40 |
16 x 16 |
Tilt dynamic range |
> ± 3 ° (≈ 400 λ) |
> ± 3 ° (≈ 200 λ) |
Focus dynamic range |
± 0.018 m to ± ∞ (≈ 350 λ) |
± 0.018 m to ± ∞ (≈ 100 λ) |
Repeatability (rms) |
< λ/200 |
< λ/200 |
Wavefront measurement accuracy in absolute mode (rms)1 |
~ λ/100 |
~ λ/100 |
Spatial resolution |
~ 110 μm |
~ 110 μm |
Maximum acquisition frequency |
100 Hz |
165 Hz |
External trigger |
TTL signal |
TTL signal |
Custom wavelength calibration |
Chosen in the 400-1100 nm range |
Chosen in the 400-1100 nm range |
Dimensions / weight |
42 x 42 x 42 mm / 150 g |
42 x 42 x 42 mm / 150 g |
Working temperature |
15 - 30° C |
15 - 30° C |
Interface / Power supply |
USB 3.0 / 2.7 W via USB |
USB 3.0 / 2.7 W via USB |
Operating system |
Win XP, Win 7 (x86/x64) |
Win XP, Win 7 (x86/x64) |
(1) wavefront as seen by the sensor. (2) difference between the real wavefront and a reference wavefront obtained in similar conditions (5 λ of shift max). |